Characteristics of BaxSr1-xTiO3 thin films by metallorganic chemical vapor deposition for ultrahigh-density DRAM application.

Autor: Min, Bigang, Roh, Jaesung S., Yan, J., Kwong, Dim-Lee
Zdroj: Proceedings of SPIE; Nov1997, Issue 1, p360-367, 8p
Databáze: Complementary Index