Analysis of surfaces, films, and multilayers by resonant laser ablation.
| Autor: | Allen, T. M., Smith, C. H., Kelly, Peter B., Anderson, John E., Eiden, Gregory C., Garrett, A. W., Gill, C. G., Hemberger, P. H., Nogar, Nicholas S. |
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| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p39-50, 12p |
| Databáze: | Complementary Index |
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