Molecular beam static secondary ion mass spectrometry for surface analysis.
| Autor: | Appelhans, Anthony D., Groenewold, Gary S., Ingram, Jani C., Dahl, D. A., Delmore, J. E. |
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| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p59-67, 9p |
| Databáze: | Complementary Index |
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