Failure characterization of nodular defects in multilayer dielectric coatings.
| Autor: | Sawicki, Rick H., Shang, Clifford C., Swatloski, T. L. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p333-343, 11p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Sawicki, Rick H., Shang, Clifford C., Swatloski, T. L. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p333-343, 11p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|