Reliability of lithium niobate Annealed Proton Exchanged integrated optical circuits.
| Autor: | Kissa, Karl M., Eng, Hogan, Lewis, David K., Rodino, Vincent D., Suchoski Jr., Paul G., Koziarz, Nancy A. |
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| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p93-98, 6p |
| Databáze: | Complementary Index |
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