Fabrication of multilayer optics by sputtering: application to EUV optics with greater than 30% normal reflectance.

Autor: Peters, Palmer N., Hoover, Richard B., Watts, Richard N., Tarrio, Charles, Walker Jr., Arthur B. C.
Zdroj: Proceedings of SPIE; Nov1995, Issue 1, p576-581, 6p
Databáze: Complementary Index