Microfocusing 4-keV to 65-keV xrays with bent Kirkpatrick-Baez mirrors.
| Autor: | Eng, Peter J., Rivers, Mark L., Yang, Bingxin X., Schildkamp, Wilfried |
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| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p41-51, 11p |
| Databáze: | Complementary Index |
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