Investigation of thin films of high- and low-absorbing substances by the method of spectroellipsometry with excitation of surface polaritons.
| Autor: | Shaikevich, Igor A., Kolesnik, Pavel V., Melnichenko, L. Y., Pasko, V. Y. |
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| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p161-164, 4p |
| Databáze: | Complementary Index |
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