Impact of attenuated mask topography on lithographic performance.

Autor: Ferguson, Richard A., Adair, William J., O'Grady, David S., Martino, Ronald M., Molless, Antoinette F., Grenon, Brian J., Wong, Alfred K. K., Liebmann, Lars W., Callegari, Alessandro, LaTulipe, Douglas C., Sprout, Donna M., Seguin, Christopher M.
Zdroj: Proceedings of SPIE; 11/ 1/1994, Issue 1, p130-139, 10p
Databáze: Complementary Index