Structural properties of Si1-xGex layers grown onto crystalline or amorphous substrates by pulsed excimer laser annealing of Ge implanted silicon.

Autor: Repplinger, Florence, Fogarassy, Eric, Grob, Adriana, Grob, Jean-Jacques, Prevot, Bernard, Stoquert, Jean-Paul, de Unamuno, Salome
Zdroj: Proceedings of SPIE; 11/ 1/1994, Issue 1, p652-658, 7p
Databáze: Complementary Index