Manufacturing and testing of a laterally graded division parameter multilayer inferential mirror for XUV.

Autor: Guichet, Christophe, Rivoira, R., Rasigni, Georges, Barchewitz, Robert J., Andre, Jean-Michel
Zdroj: Proceedings of SPIE; 11/ 1/1994, Issue 1, p287-298, 12p
Databáze: Complementary Index