Femtosecond optical characterization of nonlinear organic materials and etalon logic gates.
Autor: | Gibbons, Wayne M., Grasso, R. P., O'Brien, M. K., Shannon, Paul J., Sun, S. T., Williams, Valorie A., Ho, Winston, Peyghambarian, Nasser |
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Zdroj: | Proceedings of SPIE; Nov1990, Issue 1, p73-80, 8p |
Databáze: | Complementary Index |
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