Dispersion-assisted measurement of the refractive index and thickness by hybrid interferometer.
| Autor: | Kim, Seokhan, Na, Jihoon, Kim, Myoung Jin, Lee, Byeong Ha |
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| Zdroj: | Proceedings of SPIE; Nov2008, Issue 1, p68470X-68470X-10, 10p |
| Databáze: | Complementary Index |
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