A comprehensive reliability study of high-power 808 nm laser diodes mounted with AuSn and indium.

Autor: Kissel, Heiko, Seibold, Gabriele, Biesenbach, Jens, Groenninger, Guenther, Herrmann, Gerhard, Strauß, Uwe
Zdroj: Proceedings of SPIE; Nov2008, Issue 1, p687618-687618-10, 10p
Databáze: Complementary Index