A comprehensive reliability study of high-power 808 nm laser diodes mounted with AuSn and indium.
Autor: | Kissel, Heiko, Seibold, Gabriele, Biesenbach, Jens, Groenninger, Guenther, Herrmann, Gerhard, Strauß, Uwe |
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Zdroj: | Proceedings of SPIE; Nov2008, Issue 1, p687618-687618-10, 10p |
Databáze: | Complementary Index |
Externí odkaz: |