Split and design guidelines for double patterning.

Autor: Wiaux, Vincent, Verhaegen, Staf, Cheng, Shaunee, Iwamoto, Fumio, Jaenen, Patrick, Maenhoudt, Mireille, Matsuda, Takashi, Postnikov, Sergei, Vandenberghe, Geert
Zdroj: Proceedings of SPIE; Nov2008, Issue 1, p692409-692409-11, 11p
Databáze: Complementary Index