CCD charge transfer efficiency test with the new DES clock board.

Autor: Campa, Julia, Cardiel, Laia, Castilla, Javier, De Vicente, J., Estrada, Juan, Karliner, Inga, Kubik, Donna, Martinez, Gustavo, Shaw, Terri, Stuermer, Walter
Zdroj: Proceedings of SPIE; Nov2008 Part 2, Issue 1, p70122W-70122W-11, 11p
Databáze: Complementary Index