Performance and reliability test of MEMS optical scanners.
| Autor: | Kurth, Steffen, Kaufmann, Christian, Hahn, Ramon, Mehner, Jan, Dötzel, Wolfram, Gessner, Thomas |
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| Zdroj: | Proceedings of SPIE; Nov2007, Issue 1, p64630H-64630H-12, 12p |
| Databáze: | Complementary Index |
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