Leakage characteristics for the buried photodiode structure on vertical CMOS image sensors.
| Autor: | Lee, Sang-Gi, Lim, Su, Lee, Chang-Eun, Park, Jeong-Su, Bang, Sun-Kyung, Kang, Sung-Hyun, Martin, Russel A., Bae, Sanghoon, Park, Jin Won |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2007, Issue 1, p650206-650206-9, 9p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|