Performance analysis of a CsI-based flat panel detector in a cone beam variable resolution x-ray system.

Autor: Dahi, Bahram, Keyes, Gary S., Rendon, David A., DiBianca, Frank A.
Zdroj: Proceedings of SPIE; Nov2007, Issue 1, p65104B-65104B-8, 8p
Databáze: Complementary Index