Carbon nanotube metrology in a CD SEM.
Autor: | Yates, Colin, Rueckes, Thomas, Carter, Richard J. |
---|---|
Zdroj: | Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65180N-65180N-11, 11p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Yates, Colin, Rueckes, Thomas, Carter, Richard J. |
---|---|
Zdroj: | Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65180N-65180N-11, 11p |
Databáze: | Complementary Index |
Externí odkaz: |