OPC in memory-device patterns using boundary layer model for 3-dimensional mask topographic effect.

Autor: Kim, Young-Chang, Kim, Insung, Park, JeongGeun, Kim, Sangwook, Suh, Sungsoo, Cheon, Yongjin, Lee, Sukjoo, Lee, Junghyeon, Kang, Chang-Jin, Moon, Jootae, Cobb, Jonathan, Lee, Sooryong
Zdroj: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65200T-65200T-12, 12p
Databáze: Complementary Index