Non-scanning x-ray backscattering inspection systems based on x-ray focusing.
| Autor: | Grubsky, V., Gertsenshteyn, M., Jannson, T., Savant, G. |
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| Zdroj: | Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65401N-65401N-7, 7p |
| Databáze: | Complementary Index |
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