Pellicle factors affecting finished photomask flatness.
Autor: | Racette, K., Watts, A., Barrett, M., Nolan, R., Sasaki, Y., Kikuchi, Y., Matsumura, T. |
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Zdroj: | Proceedings of SPIE; Nov2007 Part 2, Issue 1, p66071V-66071V-8, 8p |
Databáze: | Complementary Index |
Externí odkaz: |