Pellicle factors affecting finished photomask flatness.

Autor: Racette, K., Watts, A., Barrett, M., Nolan, R., Sasaki, Y., Kikuchi, Y., Matsumura, T.
Zdroj: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p66071V-66071V-8, 8p
Databáze: Complementary Index