Characterization of thick layers of CdTe grown with MBE for the fabrication of radiation detectors.
| Autor: | Greiffenberg, D., Sorgenfrei, R., Bachem, K. H., Zwerger, A, Fiederle, M. |
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| Zdroj: | Proceedings of SPIE; Nov2007, Issue 1, p670604-670604-8, 8p |
| Databáze: | Complementary Index |
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