Integration of OPC and mask data preparation for reduced data I/O and reduced cycle time.

Autor: Morgan, Ray, Chacko, Manoj, Hung, Dan, Yeap, Johnny, Boman, Mathias
Zdroj: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p67304E-67304E-7, 7p
Databáze: Complementary Index