Performance and quality analysis of Mo-Si multilayers deposited by ion beam sputtering and magnetron sputtering.

Autor: Hiruma, Kenji, Miyagaki, Shinji, Yamanashi, Hiromasa, Tanaka, Yuusuke, Cullins, Jerry, Nishiyama, Iwao
Zdroj: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p61511V-61511V-8, 8p
Databáze: Complementary Index