A dive into clear water: immersion defect capabilities.

Autor: Streefkerk, B., Mulkens, J., Moerman, R., Stavenga, M., van der Hoeven, J., Grouwstra, C., Bruls, R., Leenders, M., Wang, S., van Dommelen, Y., Boerema, M., Jansen, H., Cummings, K., Riepen, M., Boom, H., Suddendorf, M., Huisman, P.
Zdroj: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p61540S-61540S-13, 13p
Databáze: Complementary Index