Process window OPC for reduced process variability and enhanced yield.

Autor: Krasnoperova, Azalia, Culp, James A., Graur, Ioana, Mansfield, Scott, Al-Imam, Mohamed, Maaty, Hesham
Zdroj: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p61543L-61543L-12, 12p
Databáze: Complementary Index