Degradation of thin copper conductors because of low temperature melting.

Autor: Gromov, D. G., Gavrilov, S. A., Redichev, E. N., Mochalov, A. I., Ammosov, R. M.
Zdroj: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p62600H-62600H-8, 8p
Databáze: Complementary Index