The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering.
| Autor: | Zanaveskin, M. L., Grishchenko, Yu. V., Tolstikhina, A. L., Asadchikov, V. E., Roshchin, B. S., Azarova, V. V. |
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| Zdroj: | Proceedings of SPIE; Nov2006 Part 2, Issue 1, p62601A-62601A-9, 9p |
| Databáze: | Complementary Index |
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