Approximate method of mask flatness factor in focus deviation.

Autor: Maejima, Shinroku, Shirai, Seiichiro, Imai, Akira, Nakao, Shuji, Tange, Koji, Chiba, Akira, Hosono, Kunihiro, Narimatsu, Koichiro
Zdroj: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p62833A-62833A-9, 9p
Databáze: Complementary Index