Finding the needle in the haystack: using full-chip process window analysis to qualify competing SRAF placement strategies for 65 nm.
| Autor: | Mason, Mark, Best, Shane, Zhang, Gary, Terry, Mark, Soper, Robert |
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| Zdroj: | Proceedings of SPIE; Nov2006 Part 2, Issue 1, p63491X-63491X-11, 11p |
| Databáze: | Complementary Index |
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