Application of the scattering screen for the automated measurements of spatial-power characteristics of radiation of semiconductor lasers.
| Autor: | Grishanov, A. V., Grishanov, V. N. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2005, Issue 1, p170-178, 9p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|