Evaluation of dislocation densities in HgCdTe films by high-resolution x-ray diffraction.
| Autor: | Wang, Qingxue, Yang, Jianrong, Wei, Yanfeng, Fang, Weizheng, He, Li |
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| Zdroj: | Proceedings of SPIE; Nov2005, Issue 1, p629-636, 8p |
| Databáze: | Complementary Index |
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