Second generation fluids for 193 nm immersion lithography.

Autor: Peng, Sheng, French, Roger H., Qiu, Weiming, Wheland, Robert C., Yang, Min, Lemon, Michael F., Crawford, Michael K.
Zdroj: Proceedings of SPIE; Nov2005, Issue 1, p427-434, 8p
Databáze: Complementary Index