Liquid immersion lithography at 157 nm.

Autor: Hagiwara, Takuya, Ishimaru, Toshiyuki, Tsuji, Shou, Fujii, Kiyoshi, Itakura, Yasuo, Wakabayashi, Osamu, Kawasa, Youichi, Egawa, Keiji, Uchino, Ikuo, Sumitani, Akira, Saito, Yusuke, Maeda, Kazuhiko
Zdroj: Proceedings of SPIE; Nov2005, Issue 1, p435-446, 12p
Databáze: Complementary Index