Defect quality management of 248nm alt-PSM in low-k1 condition.

Autor: Nagamura, Yoshikazu, Momose, Satoshi, Imai, Akira, Hosono, Kunihiro, Morikawa, Yasutaka, Kojima, Kouichirou, Mohri, Hiroshi
Zdroj: Proceedings of SPIE; Nov2005, Issue 1, p977-987, 11p
Databáze: Complementary Index