Defect quality management of 248nm alt-PSM in low-k1 condition.
Autor: | Nagamura, Yoshikazu, Momose, Satoshi, Imai, Akira, Hosono, Kunihiro, Morikawa, Yasutaka, Kojima, Kouichirou, Mohri, Hiroshi |
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Zdroj: | Proceedings of SPIE; Nov2005, Issue 1, p977-987, 11p |
Databáze: | Complementary Index |
Externí odkaz: |