Noise and spectroscopic performance of DEPMOSFET matrix devices for XEUS.
| Autor: | Treis, J., Fischer, P., Halker, O., Herrmann, S., Kohrs, R., Kruger, H., Lechner, P., Lutz, G., Peric, I., Porro, M., Richter, R. H., Struder, L., Trimpl, M., Wermes, N., Wolfel, S. |
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| Zdroj: | Proceedings of SPIE; Nov2005 Part 2, Issue 1, p58980X-58980X-11, 11p |
| Databáze: | Complementary Index |
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