Ultra-high accuracy optical testing: creating diffraction-limited short-wavelength optical systems.
| Autor: | Goldberg, Kenneth A., Naulleau, Patrick P., Rekawa, Senajith B., Denham, Paul E., Liddle, J. A., Gullikson, Eric M., Jackson, Keith H., Anderson, Erik H., Taylor, John S., Sommargren, Gary E., Chapman, Henry N., Phillion, Donald W., Johnson, Michael, Barty, Anton, Soufli, Regina, Spiller, Eberhard A., Walton, Christopher C., Bajt, Sasa |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2005 Part 2, Issue 1, p59000G-59000G-10, 10p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|