Metrology for the development of high-energy x-ray optics.

Autor: Gubarev, Mikhail, Ramsey, Brian, Engelhaupt, Darell, Speegle, Chet, Smithers, Martin
Zdroj: Proceedings of SPIE; Nov2005 Part 2, Issue 1, p592108-592108-8, 8p
Databáze: Complementary Index