Metrology for the development of high-energy x-ray optics.
Autor: | Gubarev, Mikhail, Ramsey, Brian, Engelhaupt, Darell, Speegle, Chet, Smithers, Martin |
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Zdroj: | Proceedings of SPIE; Nov2005 Part 2, Issue 1, p592108-592108-8, 8p |
Databáze: | Complementary Index |
Externí odkaz: |