Advanced photomask repair technology for 65nm lithography (4).

Autor: Itou, Yasutoshi, Tanaka, Yoshiyuki, Suga, Osamu, Sugiyama, Yasuhiko, Hagiwara, Ryoji, Takahashi, Haruo, Takaoka, Osamu, Kozakai, Tomokazu, Matsuda, Osamu, Suzuki, Katsumi, Okabe, Mamoru, Kikuchi, Syuichi, Uemoto, Atsushi, Yasaka, Anto, Adachi, Tatsuya, Nishida, Naoki
Zdroj: Proceedings of SPIE; Nov2005 Part 2, Issue 1, p59924Y-59924Y-8, 8p
Databáze: Complementary Index