Simulation of the image quality of an a-Si flat x-ray detector system in low-dose fluoroscopic applications.
| Autor: | Bruijns, Tom J. C., Adriaansz, Thijs, Cowen, Arnold R., Davies, Andrew G., Kengyelics, Stephen M., Kiani, Kourosh, Kroon, Han, Luijendijk, Hans A. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2000, Issue 1, p117-127, 11p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|