Experimental validation of a thermal model used to predict the image placement error of a scanned EUVL reticle.

Autor: Gianoulakis, Steven E., Craig, Marcus J., Ray-Chaudhuri, Avijit K.
Zdroj: Proceedings of SPIE; Nov2000 Part 2, Issue 1, p848-854, 7p
Databáze: Complementary Index