Printing characteristics of proximity x-ray lithography and comparison with optical lithography for 100-nm node and below.

Autor: Hasegawa, Masaki, Nakayama, Yoshinori, Yamaguchi, K., Terasawa, Tsuneo, Matsui, Yasuji
Zdroj: Proceedings of SPIE; Nov2000, Issue 1, p96-104, 9p
Databáze: Complementary Index