Influence of internal stress fields due to point defect clusters on interstitial diffusion in SiC under irradiation.
| Autor: | Rybin, Peter V., Kulikov, Dmitri V., Trushin, Yuri V., Petzoldt, J., Yankov, Rossen A. |
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| Zdroj: | Proceedings of SPIE; Nov2000 Part 2, Issue 1, p301-307, 7p |
| Databáze: | Complementary Index |
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