Picosecond imaging of hot electron emission from CMOS circuitry.
| Autor: | Ramanujachar, Kartik, Landheer, Dolf, Raymond, Sylvain, Charbonneau, N. Sylvain, Coleridge, Peter T., Wang, Tahui |
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| Zdroj: | Proceedings of SPIE; Nov2000 Part 2, Issue 1, p298-303, 6p |
| Databáze: | Complementary Index |
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