Refractive index measurement for planar photonic crystal using a microscopy-spectrometry method.
| Autor: | Ouyang, Mike X., Onyiriuka, Emmanuel C., Kinney, L. D. |
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| Zdroj: | Proceedings of SPIE; Nov2000, Issue 1, p19-22, 4p |
| Databáze: | Complementary Index |
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