Reliability of wide bandgap semiconductor diode lasers.
| Autor: | Yellen, Steven L., Waters, Robert G., Serreze, Harvey B., Shepard, Allan H., Baumann, John A., Dalby, Richard J. |
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| Zdroj: | Proceedings of SPIE; Nov1992, Issue 1, p229-240, 12p |
| Databáze: | Complementary Index |
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