Evaluation of the band offsets of GaAs/GaInP multilayers by electroreflectance.

Autor: Razeghi, Manijeh, Yang, Daniel, Garland, James W., Zhang, Zhijie, Xue, Dazhong
Zdroj: Proceedings of SPIE; Nov1992, Issue 1, p130-138, 9p
Databáze: Complementary Index